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Authors: E. Venialgo, N. Lusardi, A. Geraci, K. O'Neill, S. Gnecchi, C. Jackson, S. E. Brunner, D. R. Schaart, E. Charbon
Journal title: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)
Journal publisher: IEEE
Published year: 2016
Published pages: 1-5
DOI identifier: 10.1109/NSSMIC.2016.8069881
ISBN: 978-1-5090-1642-6