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Authors: Tushar Sharma, Marios Fragkoulis, Diomidis Spinellis
Journal title: 2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)
Journal publisher: IEEE
Published year: 2017
Published pages: 424-429
DOI identifier: 10.1109/ESEM.2017.57
ISBN: 978-1-5090-4039-1