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Authors: Yichao Liu, Joeri Frederik, Alessandro Fontanella, Riccardo M.G. Ferrari, Jan-Willem van Wingerden
Journal title: 2020 American Control Conference (ACC)
Journal publisher: IEEE
Published year: 2020
Published pages: 4077-4082
DOI identifier: 10.23919/acc45564.2020.9147695
ISBN: 978-1-5386-8266-1