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Authors: C. Gursoy, M. Jenihhin, A. S. Oyeniran, D. Piumatti, J. Raik, M. Sonza Reorda, R. Ubar
Journal title: 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-4
DOI identifier: 10.1109/ddecs.2019.8724642
ISBN: 978-1-7281-0073-9
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