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Authors: Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer
Journal title: 2020 IEEE European Test Symposium (ETS)
Journal publisher: IEEE
Published year: 2020
Published pages: 1-6
DOI identifier: 10.1109/ets48528.2020.9131568
ISBN: 978-1-7281-4312-5