Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features

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Authors: Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone

Journal title: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-7

DOI identifier: 10.1109/iolts50870.2020.9159751

ISBN: 978-1-7281-8187-5