A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

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Authors: Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui

Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2020

Published pages: 792-797

DOI identifier: 10.23919/date48585.2020.9116278

ISBN: 978-3-9819263-4-7