Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks

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Authors: Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone

Journal title: 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-6

DOI identifier: 10.1109/dtis.2019.8735052

ISBN: 978-1-7281-3424-6