Untestable faults identification in GPGPUs for safety-critical applications

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Authors: Josie E. Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda

Journal title: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Journal publisher: IEEE

Published year: 2019

Published pages: 570-573

DOI identifier: 10.1109/icecs46596.2019.8964677

ISBN: 978-1-7281-0996-1