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Authors: Stefano di Carlo, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Journal title: 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-6
DOI identifier: 10.1109/ddecs.2019.8724672
ISBN: 978-1-7281-0073-9