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Authors: Dmytro Petryk, Zoya Dyka, Jens Katzer, Peter Langendorfer
Journal title: 2020 IEEE East-West Design & Test Symposium (EWDTS)
Journal publisher: IEEE
Published year: 2020
Published pages: 1-6
DOI identifier: 10.1109/ewdts50664.2020.9225092
ISBN: 978-1-7281-9899-6