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Authors: M. Jenihhin, S. Hamdioui, M. Sonza Reorda, M. Krstic, P. Langendorfer, C. Sauer, A. Klotz, M. Huebner, J. Nolte, H. T. Vierhaus, G. Selimis, D. Alexandrescu, M. Taouil, G. J. Schrijen, J. Raik, L. Sterpone, G. Squillero, Z. Dyka
Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2020
Published pages: 388-393
DOI identifier: 10.23919/date48585.2020.9116558
ISBN: 978-3-9819263-4-7
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