Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

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Authors: T. Copetti, G. C. Medeiros, M. Taouil, S. Hamdioui, L. B. Poehls and T. Balen

Journal publisher: 2020 IEEE Latin-American Test Symposium (LATS)

Published year: 2020

DOI identifier: 10.1109/lats49555.2020.9093667