Testing the Divergence Stack Memory on GPGPUs: A Modular in-Field Test Strategy

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Authors: Josie E Rodriguez Condia, M. Sonza Reorda

Journal title: 2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC)

Journal publisher: IEEE

Published year: 2020

Published pages: 153-158

DOI identifier: 10.1109/vlsi-soc46417.2020.9344088

ISBN: 978-1-7281-5409-1