A dynamic reconfiguration mechanism to increase the reliability of GPGPUs

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Authors: Josie E. Rodriguez Condia, Pierpaolo Narducci, M. Sonza Reorda, L. Sterpone

Journal title: 2020 IEEE 38th VLSI Test Symposium (VTS)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-6

DOI identifier: 10.1109/vts48691.2020.9107572

ISBN: 978-1-7281-5359-9