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Authors: Josie E. RodriguezCondia, Boyang Du, Matteo Sonza Reorda, Luca Sterpone
Journal title: Microelectronics Reliability
Journal publisher: Elsevier BV
Published year: 2020
DOI identifier: 10.1016/j.microrel.2020.113660
ISSN: 0026-2714
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