On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks

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Authors: Aleksa Damljanovic, Giovanni Squillero, Cemil Cem Guursoy, Maksim Jenihhin

Journal title: 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC)

Journal publisher: IEEE

Published year: 2019

Published pages: 335-340

DOI identifier: 10.1109/vlsi-soc.2019.8920313

ISBN: 978-1-7281-3915-9