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Authors: Raphael Segabinazzi Ferreira, Jorg Nolte, Fabian Vargas, Nevin George, Michael Hubner
Journal title: 2020 IEEE Latin-American Test Symposium (LATS)
Journal publisher: IEEE
Published year: 2020
Published pages: 1-6
DOI identifier: 10.1109/lats49555.2020.9093692
ISBN: 978-1-7281-8731-0