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Authors: M. M. Goncalves; Josie E. Rodriguez Condia; M. Sonza Reorda, L. Sterpone and J. R. Azambuja
Journal title: Microelectronics Reliability
Journal number: Volume 114, November 2020 113768
Journal publisher: Elsevier BV
Published year: 2020
DOI identifier: 10.1016/j.microrel.2020.113768
ISSN: 0026-2714
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