Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: J. Chen, T. Lange, M. Andjelkovic, A. Simevski, M. Krstic

Journal title: Microelectronics Reliability

Journal number: 114

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 113799

DOI identifier: 10.1016/j.microrel.2020.113799

ISSN: 0026-2714