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Authors: Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer
Journal title: 2019 IEEE 28th Asian Test Symposium (ATS)
Journal publisher: IEEE
Published year: 2019
Published pages: 129-1295
DOI identifier: 10.1109/ats47505.2019.00024
ISBN: 978-1-7281-2695-1