Modeling Static Noise Margin for FinFET based SRAM PUFs

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Authors: S. Masoumian, G. Selimis, R. Maes, G. Schrijen, S. Hamdioui and M. Taouil

Journal title: 2020 IEEE European Test Symposium (ETS)

Journal publisher: IEEE

Published year: 2020

Published pages: pp. 1-6.

DOI identifier: 10.1109/ets48528.2020.9131583