On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: T. Lange, A. Balakrishnan, M. Glorieux, D. Alexandrescu and L. Sterpone,

Journal publisher: IEEE

Published year: 2019

DOI identifier: 10.1109/dsn-s.2019.00021