A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks

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Authors: Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero

Journal title: 2018 IEEE International Test Conference in Asia (ITC-Asia)

Journal publisher: IEEE

Published year: 2018

Published pages: 55-60

DOI identifier: 10.1109/ITC-Asia.2018.00020

ISBN: 978-1-5386-5180-3