DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

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Authors: Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui

Journal title: 2019 IEEE European Test Symposium (ETS)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-2

DOI identifier: 10.1109/ets.2019.8791517

ISBN: 978-1-7281-1173-5