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Authors: Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero
Journal title: 2018 IEEE International Test Conference (ITC)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-9
DOI identifier: 10.1109/test.2018.8624742
ISBN: 978-1-5386-8382-8