Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks

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Authors: A. Damljanovic, A. Jutman, G. Squillero and A. Tsertov

Journal title: Proc. IEEE European Test Symposium 2019 (in press)

Journal publisher: IEEE

Published year: 2019

DOI identifier: 10.5281/zenodo.3362602