Mixed-level identification of fault redundancy in microprocessors

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Authors: Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gursoy, Jaan Raik

Journal title: 2019 IEEE Latin American Test Symposium (LATS)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-6

DOI identifier: 10.1109/latw.2019.8704591

ISBN: 978-1-7281-1756-0