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Authors: D.H.P. Kraak, C.C. Gursoy, I.O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui
Journal title: 2019 IEEE Latin American Test Symposium (LATS)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-6
DOI identifier: 10.1109/latw.2019.8704595
ISBN: 978-1-7281-1756-0
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