Soft-Error Rate Due to Single-Event Transients in Clock Distribution Networks

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Authors: Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone

Journal title: 8th Biannual European - Latin American Summer School on Design, Test and Reliability

Journal number: 20-22 June 2018

Journal publisher: 8th Biannual European - Latin American Summer School on Design, Test and Reliability

Published year: 2018