Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits

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Authors: Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone

Journal title: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)

Journal publisher: IEEE

Published year: 2019

Published pages: 7-14

DOI identifier: 10.1109/iolts.2019.8854423

ISBN: 978-1-7281-2490-2