High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors

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Authors: Adeboye Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gursoy, Jaan Raik

Journal title: Proc. IEEE European Test Symposium 2019 (in press)

Journal publisher: IEEE

Published year: 2019