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Authors: Aleksa Damljanovic, Artur Jutman, Michele Portolan, Ernesto Sanchez, Giovanni Squillero, Anton Tsertov
Journal title: 2019 IEEE International Test Conference (ITC)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-8
DOI identifier: 10.1109/itc44170.2019.9000181
ISBN: 978-1-7281-4823-6