Representing Gate-Level SET Faults by Multiple SEU Faults at RTL

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer

Journal title: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-6

DOI identifier: 10.1109/iolts50870.2020.9159715

ISBN: 978-1-7281-8187-5