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Authors: Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Sanchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer
Journal title: 2020 IEEE 38th VLSI Test Symposium (VTS)
Journal publisher: IEEE
Published year: 2020
Published pages: 1-9
DOI identifier: 10.1109/vts48691.2020.9107599
ISBN: 978-1-7281-5359-9