Evaluation of the Sensitivity of RRAM Cells to Optical Fault Injection Attacks

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Dmytro Petryk, Zoya Dyka, Eduardo Perez, Mamathamba Kalishettyhalli Mahadevaiaha, Ievgen Kabin, Christian Wenger, Peter Langendorfer

Journal title: 2020 23rd Euromicro Conference on Digital System Design (DSD)

Journal publisher: IEEE

Published year: 2020

Published pages: 238-245

DOI identifier: 10.1109/dsd51259.2020.00047

ISBN: 978-1-7281-9535-3