Summary
This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.
Authors: Xinhui Lai, Maksim Jenihhin, Jaan Raik, Kolin Paul
Journal title: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Journal publisher: IEEE
Published year: 2019
Published pages: 239-242
DOI identifier: 10.1109/iolts.2019.8854458
ISBN: 978-1-7281-2490-2