Challenges of Reliability Assessment and Enhancement in Autonomous Systems

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Authors: Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu

Journal title: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-6

DOI identifier: 10.1109/dft.2019.8875379

ISBN: 978-1-7281-2260-1