Sensitivity of Standard Library Cells to Optical Fault Injection Attacks in IHP 250 nm Technology

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Authors: Dmytro Petryk, Zoya Dyka, Peter Langendorfer

Journal title: 2020 9th Mediterranean Conference on Embedded Computing (MECO)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-4

DOI identifier: 10.1109/meco49872.2020.9134146

ISBN: 978-1-7281-6949-1