A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs

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Authors: G.C. Medeiros, L.M. Bolzani Poehls, M. Taouil, F. Luis Vargas, S. Hamdioui

Journal title: Microelectronics Reliability

Journal number: 88-90

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 355-359

DOI identifier: 10.1016/j.microrel.2018.07.092

ISSN: 0026-2714