Double cell upsets mitigation through triple modular redundancy

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Yuanqing Li, Anselm Breitenreiter, Marko Andjelkovic, Junchao Chen, Milan Babic, Milos Krstic

Journal title: Microelectronics Journal

Journal number: 96

Journal publisher: Mackintosh Publications

Published year: 2020

Published pages: 104683

DOI identifier: 10.1016/j.mejo.2019.104683

ISSN: 0026-2692