Defect identification based on first-principles calculations for deep level transient spectroscopy

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Authors: Darshana Wickramaratne, Cyrus E. Dreyer, Bartomeu Monserrat, Jimmy-Xuan Shen, John L. Lyons, Audrius Alkauskas, Chris G. Van de Walle

Journal title: Applied Physics Letters

Journal number: 113/19

Journal publisher: American Institute of Physics

Published year: 2018

Published pages: 192106

DOI identifier: 10.1063/1.5047808

ISSN: 0003-6951