Tutorial: Defects in semiconductors—Combining experiment and theory

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Authors: Audrius Alkauskas, Matthew D. McCluskey, Chris G. Van de Walle

Journal title: Journal of Applied Physics

Journal number: 119/18

Journal publisher: American Institute of Physics

Published year: 2016

Published pages: 181101

DOI identifier: 10.1063/1.4948245

ISSN: 0021-8979