Performance and reliability in back-gated CVD-grown MoS2 devices

Summary

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Authors: Carlos Marquez, Norberto Salazar, Farzan Gity, Jose C. Galdon, Carlos Navarro, Ray Duffy, Paul Hurley, Francisco Gamiz

Journal title: Solid-State Electronics

Journal number: 186

Journal publisher: Pergamon Press Ltd.

Published year: 2021

Published pages: 108173

DOI identifier: 10.1016/j.sse.2021.108173

ISSN: 0038-1101