Summary
Optical and x-ray methods will be reviewed, selected and further developed for the post-process measurement of the internal and external form of AM parts. In the optical case (UNOTT), modelling of the instrument response will be used to reduce systematic errors and improve instrument bandwidth (therefore, allowing the complex structures produced by AM to be measured effectively). In the X-ray CT case (UNIPD), standard methods for measuring AM parts and for estimating measurement uncertainties will be developed, and good practice guidance will be produced. The most appropriate post-process instrumentation and its use for the end-user case studies will be selected.
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