A new conversion approach between different characterization methods to measure the spot size of micro computed tomography systems

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Markus Baier Filippo Zanini Enrico Savio Simone Carmignato

Journal title: Conference Proceedings 18th International Conference & Exhibition

Journal number: 18

Journal publisher: EUSPEN

Published year: 2018

Published pages: 445-446

ISBN: 978-0-9957751-2-1