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Authors: P. Escobedo, I.M. Perez de Vargas-Sansalvador, N. Lopez-Ruiz, L.F. Capitan-Vallvey, A.J. Palma, M.A. Carvajal, A. Martinez-Olmos
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
Published pages: 1-1
DOI identifier: 10.1109/tim.2019.2911757
ISSN: 0018-9456