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Authors: N. Atanov, V. Baranov, J. Budagov, Yu. I. Davydov, V. Glagolev, V. Tereshchenko, Z. Usubov, F. Cervelli, S. Di Falco, S. Donati, L. Morescalchi, E. Pedreschi, G. Pezzullo, F. Raffaelli, F. Spinella, F. Colao, M. Cordelli, G. Corradi, E. Diociaiuti, R. Donghia, S. Giovannella, F. Happacher, M. Martini, S. Miscetti, M. Ricci, A. Saputi, I. Sarra, B. Echenard, D. G. Hitlin, T. Miyashita, F. Porter, R
Journal title: IEEE Transactions on Nuclear Science
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 1-1
DOI identifier: 10.1109/TNS.2018.2790702
ISSN: 0018-9499
- Not specified