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Authors: N. Atanov, V. Baranov, F. Colao, M. Cordelli, G. Corradi, E. Dane, Yu. I. Davydov, K. Flood, S. Giovannella, V. Glagolev, F. Happacher, D. G. Hitlin, M. Martini, S. Miscettti, T. Miyashita, L. Morescalchi, P. Ott, G. Pezzullo, A. Saputi, I. Sarra, S. R. Soleti, G. Tassielli, V. Tereshchenko, A. Thomas
Journal title: IEEE Transactions on Nuclear Science
Journal number: 63/2
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2016
Published pages: 596-604
DOI identifier: 10.1109/TNS.2016.2522818
ISSN: 0018-9499