High-resolution interference microscopy with spectral resolution for the characterization of individual particles and self-assembled meta-atoms

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Authors: Michail Symeonidis, Radius N. S. Suryadharma, Rossella Grillo, Andreas Vetter, Carsten Rockstuhl, Thomas Bürgi, Toralf Scharf

Journal title: Optics Express

Journal number: 27/15

Journal publisher: Optical Society of America

Published year: 2019

Published pages: 20990

DOI identifier: 10.1364/oe.27.020990

ISSN: 1094-4087